Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Hatsui T.; Galli D.E.; You D.; Neagu L.; Ueda K.; Niozu A.; Tono K.; Kameshima T.; Takanashi T.; Colombo A.; Miron C.; Sato Y.; Joti Y.; Pincelli T.; Katayama T.; Kumagai Y.; Asa K.; Callegari C.; Rossi G.; Nishiyama T.; Ono T.; Kukk E.; Bucher M.; Li Y.; Togashi T.; Fraia M.D.; Nagaya K.; Bostedt C.; Owada S.; Yabashi M.; Matsuda K.; Ito Y.; Fukuzawa H.; Motomura K.
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Hatsui T.
Galli D.E.
You D.
Neagu L.
Ueda K.
Niozu A.
Tono K.
Kameshima T.
Takanashi T.
Colombo A.
Miron C.
Sato Y.
Joti Y.
Pincelli T.
Katayama T.
Kumagai Y.
Asa K.
Callegari C.
Rossi G.
Nishiyama T.
Ono T.
Kukk E.
Bucher M.
Li Y.
Togashi T.
Fraia M.D.
Nagaya K.
Bostedt C.
Owada S.
Yabashi M.
Matsuda K.
Ito Y.
Fukuzawa H.
Motomura K.
Katso/Avaa
Lataukset: 

doi:10.1088/1742-6596/1412/20/202028
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Julkaisun pysyvä osoite on:
https://urn.fi/URN:NBN:fi-fe2021042826894
Tiivistelmä

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

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