Texture Representation Through Overlapped Multi-Oriented Tri-Scale Local Binary Pattern

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dc.contributor.authorFawad
dc.contributor.authorMuhammad Jamil Khan
dc.contributor.authorMuhammad Ali Riaz
dc.contributor.authorHumayun Shahid
dc.contributor.authorMansoor Shaukat Khan
dc.contributor.authorYasar Amin
dc.contributor.authorJonathan Loo
dc.contributor.authorHannu Tenhunen
dc.contributor.organizationfi=sulautettu elektroniikka|en=Embedded Electronics|
dc.contributor.organization-code1.2.246.10.2458963.20.20754768032
dc.converis.publication-id45244320
dc.converis.urlhttps://research.utu.fi/converis/portal/Publication/45244320
dc.date.accessioned2022-10-28T13:56:41Z
dc.date.available2022-10-28T13:56:41Z
dc.format.pagerange66668
dc.format.pagerange66679
dc.identifier.eissn2169-3536
dc.identifier.jour-issn2169-3536
dc.identifier.olddbid185341
dc.identifier.oldhandle10024/168435
dc.identifier.urihttps://www.utupub.fi/handle/11111/42080
dc.identifier.urnURN:NBN:fi-fe2021042824373
dc.language.isoen
dc.okm.affiliatedauthorTenhunen, Hannu
dc.okm.discipline213 Electronic, automation and communications engineering, electronicsen_GB
dc.okm.discipline213 Sähkö-, automaatio- ja tietoliikennetekniikka, elektroniikkafi_FI
dc.okm.internationalcopublicationinternational co-publication
dc.okm.internationalityInternational publication
dc.okm.typeA1 ScientificArticle
dc.publisherIEEE
dc.publisher.countryUnited Statesen_GB
dc.publisher.countryYhdysvallat (USA)fi_FI
dc.publisher.country-codeUS
dc.relation.doi10.1109/ACCESS.2019.2918004
dc.relation.ispartofjournalIEEE Access
dc.relation.volume7
dc.source.identifierhttps://www.utupub.fi/handle/10024/168435
dc.titleTexture Representation Through Overlapped Multi-Oriented Tri-Scale Local Binary Pattern
dc.year.issued2019

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