Linewidth measurement of external cavity lasers

dc.contributor.authorKuusela, Tom A.
dc.contributor.organizationfi=kvanttioptiikan laboratorio|en=Laboratory of Quantum Optics|
dc.contributor.organization-code1.2.246.10.2458963.20.63398691327
dc.converis.publication-id457044522
dc.converis.urlhttps://research.utu.fi/converis/portal/Publication/457044522
dc.date.accessioned2025-08-28T03:07:51Z
dc.date.available2025-08-28T03:07:51Z
dc.description.abstractNarrowband laser sources are used in applications that require high-precision or stable optical frequency. Such applications include high-resolution spectroscopy, long-distance measurement, and coherent optical communication. The linewidth of a laser is a direct measure of the laser's stability; therefore, characterization of laser linewidth is essential. In practice, however, determining a laser's linewidth is not a trivial task and typically requires expensive equipment or a complex experimental arrangement. This paper presents a straightforward, low-cost method based on unbalanced interferometry, which allows us to determine the visibility of fringe patterns as a function of the optical path difference and, consequently, the linewidth of the laser. As a test laser, we use a tunable external cavity laser source at around 780 nm, where an interference filter is employed for wavelength selection. Data obtained by applying the interferometric technique to this laser and the analysis of these data, along with the resulting linewidth value, are presented. Given that the described measurement setup is inexpensive, straightforward, and pedagogically accessible, it is well-suited for an instructional physics laboratory experiment and will also be of interest to laboratory researchers. (c) 2024 Published under an exclusive license by American Association of Physics Teachers.
dc.format.pagerange459
dc.format.pagerange465
dc.identifier.eissn1943-2909
dc.identifier.jour-issn0002-9505
dc.identifier.olddbid210244
dc.identifier.oldhandle10024/193271
dc.identifier.urihttps://www.utupub.fi/handle/11111/51103
dc.identifier.urlhttps://doi.org/10.1119/5.0207084
dc.identifier.urnURN:NBN:fi-fe2025082792658
dc.language.isoen
dc.okm.affiliatedauthorKuusela, Tom
dc.okm.discipline114 Physical sciencesen_GB
dc.okm.discipline114 Fysiikkafi_FI
dc.okm.internationalcopublicationnot an international co-publication
dc.okm.internationalityInternational publication
dc.okm.typeA1 ScientificArticle
dc.publisherAIP Publishing
dc.publisher.countryUnited Statesen_GB
dc.publisher.countryYhdysvallat (USA)fi_FI
dc.publisher.country-codeUS
dc.publisher.placeMELVILLE
dc.relation.doi10.1119/5.0207084
dc.relation.ispartofjournalAmerican Journal of Physics
dc.relation.issue6
dc.relation.volume92
dc.source.identifierhttps://www.utupub.fi/handle/10024/193271
dc.titleLinewidth measurement of external cavity lasers
dc.year.issued2024

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