Surface topography and electrical properties in Sr2FeMoO6 films studied at cryogenic temperatures

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dc.contributor.authorI. Angervo
dc.contributor.authorM. Saloaro
dc.contributor.authorJ. Mäkelä
dc.contributor.authorJ.-P. Lehtiö
dc.contributor.authorH. Huhtinen
dc.contributor.authorP. Paturi
dc.contributor.organizationfi=Wihurin fysiikantutkimuslaboratorio|en=Wihuri Physical Laboratory|
dc.contributor.organizationfi=fysiikan ja tähtitieteen laitos|en=Department of Physics and Astronomy|
dc.contributor.organizationfi=materiaalitutkimuksen laboratorio|en=Materials Research Laboratory|
dc.contributor.organization-code1.2.246.10.2458963.20.15561262450
dc.contributor.organization-code1.2.246.10.2458963.20.26581883332
dc.contributor.organization-code1.2.246.10.2458963.20.55477946762
dc.contributor.organization-code2606706
dc.converis.publication-id32080270
dc.converis.urlhttps://research.utu.fi/converis/portal/Publication/32080270
dc.date.accessioned2022-10-27T11:44:09Z
dc.date.available2022-10-27T11:44:09Z
dc.description.abstract<p>Pulsed laser deposited Sr<sub>2</sub>FeMoO<sub>6</sub> thin films were investigated for the first time with scanning tunneling microscopy and spectroscopy. The results confirm atomic scale layer growth, with step-terrace structure corresponding to a single lattice cell scale. The spectroscopy research reveals a distribution of local electrical properties linked to structural deformation in the initial thin film layers at the film substrate interface. Significant hole structure giving rise to electrically distinctive regions in thinner film also seems to set a thickness limit for the thinnest films to be used in applications.</p>
dc.identifier.issn1742-6588
dc.identifier.jour-issn1742-6588
dc.identifier.olddbid171774
dc.identifier.oldhandle10024/154868
dc.identifier.urihttps://www.utupub.fi/handle/11111/29410
dc.identifier.urnURN:NBN:fi-fe2021042719355
dc.language.isoen
dc.okm.affiliatedauthorAngervo, Ilari
dc.okm.affiliatedauthorSaloaro, Minnamari
dc.okm.affiliatedauthorMäkelä, Jaakko
dc.okm.affiliatedauthorLehtiö, Juha-Pekka
dc.okm.affiliatedauthorHuhtinen, Hannu
dc.okm.affiliatedauthorPaturi, Petriina
dc.okm.discipline114 Physical sciencesen_GB
dc.okm.discipline114 Fysiikkafi_FI
dc.okm.internationalcopublicationnot an international co-publication
dc.okm.internationalityInternational publication
dc.okm.typeA4 Conference Article
dc.publisher.countryUnited Kingdomen_GB
dc.publisher.countryBritanniafi_FI
dc.publisher.country-codeGB
dc.relation.conferenceInternational Conference on Low Temperature Physics
dc.relation.doi10.1088/1742-6596/969/1/012107
dc.relation.ispartofjournalJournal of Physics: Conference Series
dc.relation.volume1
dc.relation.volume969
dc.source.identifierhttps://www.utupub.fi/handle/10024/154868
dc.titleSurface topography and electrical properties in Sr2FeMoO6 films studied at cryogenic temperatures
dc.title.book28th International Conference on Low Temperature Physics (LT28) 9–16 August 2017, Gothenburg, Sweden
dc.year.issued2018

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