X-ray polarimetry as a new method of studying X-ray binary systems

dc.contributor.authorBocharova, Anastasiia
dc.contributor.departmentfi=Fysiikan ja tähtitieteen laitos|en=Department of Physics and Astronomy|
dc.contributor.facultyfi=Matemaattis-luonnontieteellinen tiedekunta|en=Faculty of Science|
dc.contributor.studysubjectfi=Fysikaaliset tieteet|en=Physical Sciences|
dc.date.accessioned2025-06-12T21:05:25Z
dc.date.available2025-06-12T21:05:25Z
dc.date.issued2025-05-22
dc.description.abstractThis thesis investigates black hole X-ray binaries through multi-instrument observational data, focusing on spectral and polarimetric analysis. These systems, in which a black hole accretes matter from a companion star, serve as laboratories for studying extreme astrophysical processes. The study combines data from the Imaging X-ray Polarimetry Explorer (IXPE) and complementary X-ray missions to analyze three black hole binaries: Cygnus X-1, Cygnus X-3, and the transient Swift J1727.8–1613. X-ray polarimetry, enabled for the first time with imaging sensitivity by IXPE, has opened a new observational window into the inner regions of accreting black holes. The IXPE campaign on Cygnus X-1 provided the first detailed view of polarization changes across spectral states, constraining the evolving geometry of the corona. For Swift J1727.8–1613, the broadband spectrum during its hard-to-soft state transition was successfully described by a two-phase disk–corona model. In the case of Cygnus X-3, X-ray polarimetry uncovered the unique nature of its emission, shaped by complex scattering environments. These results demonstrate how X-ray polarimetry provides direct insight into the geometry, orientation, and physical conditions of the innermost accretion flows - information previously inaccessible with traditional spectroscopy or timing alone. As a revolutionary tool in high-energy astrophysics, polarimetry significantly improves our ability to study black holes and their vicinity.
dc.format.extent57
dc.identifier.olddbid199104
dc.identifier.oldhandle10024/182142
dc.identifier.urihttps://www.utupub.fi/handle/11111/20267
dc.identifier.urnURN:NBN:fi-fe2025061267095
dc.language.isoeng
dc.rightsfi=Julkaisu on tekijänoikeussäännösten alainen. Teosta voi lukea ja tulostaa henkilökohtaista käyttöä varten. Käyttö kaupallisiin tarkoituksiin on kielletty.|en=This publication is copyrighted. You may download, display and print it for Your own personal use. Commercial use is prohibited.|
dc.rights.accessrightsavoin
dc.source.identifierhttps://www.utupub.fi/handle/10024/182142
dc.subjecthigh-energy astrophysics, X-ray binaries, polarization, spectral analysis
dc.titleX-ray polarimetry as a new method of studying X-ray binary systems
dc.type.ontasotfi=Pro gradu -tutkielma|en=Master's thesis|

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