RADAR: Raman Spectral Analysis Using Deep Learning for Artifact Removal

dc.contributor.authorSjöberg, Joel
dc.contributor.authorSiminea, Nicoleta
dc.contributor.authorPaun, Andrei
dc.contributor.authorLita, Adrian
dc.contributor.authorLarion, Mioara
dc.contributor.authorPetre, Ion
dc.contributor.organizationfi=matematiikka|en=Mathematics|
dc.contributor.organization-code1.2.246.10.2458963.20.41687507875
dc.converis.publication-id499203657
dc.converis.urlhttps://research.utu.fi/converis/portal/Publication/499203657
dc.date.accessioned2025-08-27T22:40:36Z
dc.date.available2025-08-27T22:40:36Z
dc.description.abstract<p>Raman spectroscopy is a non-destructive analytical technique that reveals molecular vibrations, enabling precise identification of chemical compounds and material properties. Its spatial resolution and compatibility with microscopic imaging allow for high-resolution chemical mapping of heterogeneous samples. However, spectral artifacts such as baseline drift, cosmic rays, and instrumental noise complicate data interpretation, necessitating correction. RADAR is introduced, two lightweight deep learning models for artifact removal, capable of simultaneous denoising and correction of Raman spectra, significantly accelerating high-quality data acquisition. The models help reduce the data acquisition time by 90% while preserving signal integrity, as demonstrated on noisy spectra from a diversity of samples, biological and non-biological. These models are versatile and can be readily applied to novel Raman datasets, offering an order-of-magnitude improvement in acquisition efficiency. This work advances Raman spectroscopy as a faster, more reliable tool for chemical analysis, with broad applications in materials science, biomedical research, and beyond.</p>
dc.identifier.eissn2195-1071
dc.identifier.jour-issn2195-1071
dc.identifier.olddbid202595
dc.identifier.oldhandle10024/185622
dc.identifier.urihttps://www.utupub.fi/handle/11111/47708
dc.identifier.urlhttps://doi.org/10.1002/adom.202500736
dc.identifier.urnURN:NBN:fi-fe2025082789837
dc.language.isoen
dc.okm.affiliatedauthorSjöberg, Joel
dc.okm.affiliatedauthorPetre, Ion
dc.okm.discipline113 Computer and information sciencesen_GB
dc.okm.discipline216 Materials engineeringen_GB
dc.okm.discipline113 Tietojenkäsittely ja informaatiotieteetfi_FI
dc.okm.discipline216 Materiaalitekniikkafi_FI
dc.okm.internationalcopublicationinternational co-publication
dc.okm.internationalityInternational publication
dc.okm.typeA1 ScientificArticle
dc.publisherWILEY-V C H VERLAG GMBH
dc.publisher.countryGermanyen_GB
dc.publisher.countrySaksafi_FI
dc.publisher.country-codeDE
dc.publisher.placeWEINHEIM
dc.relation.articlenumber2500736
dc.relation.doi10.1002/adom.202500736
dc.relation.ispartofjournalAdvanced Optical Materials
dc.source.identifierhttps://www.utupub.fi/handle/10024/185622
dc.titleRADAR: Raman Spectral Analysis Using Deep Learning for Artifact Removal
dc.year.issued2025

Tiedostot

Näytetään 1 - 1 / 1
Ladataan...
Name:
Advanced Optical Materials - 2025 - Sjöberg - RADAR Raman Spectral Analysis Using Deep Learning for Artifact Removal.pdf
Size:
5.06 MB
Format:
Adobe Portable Document Format