On Unique Error Patterns in the Levenshtein’s Sequence Reconstruction Model

dc.contributor.authorJunnila, Ville
dc.contributor.authorLaihonen, Tero
dc.contributor.authorLehtilä, Tuomo
dc.contributor.organizationfi=matematiikka|en=Mathematics|
dc.contributor.organization-code1.2.246.10.2458963.20.41687507875
dc.converis.publication-id498433789
dc.converis.urlhttps://research.utu.fi/converis/portal/Publication/498433789
dc.date.accessioned2026-01-21T12:28:47Z
dc.date.available2026-01-21T12:28:47Z
dc.description.abstractIn the Levenshtein’s sequence reconstruction problem a codeword is transmitted through N channels and in each channel a set of errors is introduced to the transmitted word. In previous works, the restriction that each channel provides a unique output word has been essential. In this work, we assume only that each channel introduces a unique set of errors to the transmitted word and hence, some output words can also be identical. As we will discuss, this interpretation is both natural and useful for deletion and insertion errors. We give properties, techniques and (optimal) results for this situation. Quaternary alphabets are relevant due to applications related to DNA-memories. Hence, we introduce an efficient Las Vegas style decoding algorithm for simultaneous insertion, deletion and substitution errors in q-ary Hamming spaces for q ≥ 4.
dc.identifier.eissn1557-9654
dc.identifier.jour-issn0018-9448
dc.identifier.olddbid212541
dc.identifier.oldhandle10024/195559
dc.identifier.urihttps://www.utupub.fi/handle/11111/52546
dc.identifier.urlhttps://doi.org/10.1109/tit.2025.3568068
dc.identifier.urnURN:NBN:fi-fe2025082790781
dc.language.isoen
dc.okm.affiliatedauthorJunnila, Ville
dc.okm.affiliatedauthorLaihonen, Tero
dc.okm.affiliatedauthorLehtilä, Tuomo
dc.okm.discipline113 Computer and information sciencesen_GB
dc.okm.internationalcopublicationnot an international co-publication
dc.okm.internationalityInternational publication
dc.okm.typeA1 ScientificArticle
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.publisher.countryUnited Statesen_GB
dc.publisher.countryYhdysvallat (USA)fi_FI
dc.publisher.country-codeUS
dc.relation.doi10.1109/TIT.2025.3568068
dc.relation.ispartofjournalIEEE Transactions on Information Theory
dc.source.identifierhttps://www.utupub.fi/handle/10024/195559
dc.titleOn Unique Error Patterns in the Levenshtein’s Sequence Reconstruction Model
dc.year.issued2025

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