Expected and realized returns in conditional asset pricing: A new testing approach

dc.contributor.authorJan Antell
dc.contributor.authorMika Vaihekoski
dc.contributor.organizationfi=laskentatoimi ja rahoitus|en=Accounting and Finance|
dc.contributor.organization-code1.2.246.10.2458963.20.32184342841
dc.converis.publication-id40053103
dc.converis.urlhttps://research.utu.fi/converis/portal/Publication/40053103
dc.date.accessioned2022-10-28T12:36:01Z
dc.date.available2022-10-28T12:36:01Z
dc.description.abstract<p>We develop a new approach for testing conditional asset pricing models that avoids the issues in using realized returns as a proxy for expected returns. Testable restrictions are developed by asking what realized returns we would observe, given the pricing model under scrutiny. The new reverse testing approach is used to test the Merton ICAPM and a long-standing risk–return puzzle: the price of market risk has often turned out to be insignificant and at times even negative. The results from the new testing approach on US data give strong support for a positive relationship between conditional variance and the equity premium.</p>
dc.format.pagerange220
dc.format.pagerange236
dc.identifier.eissn1879-1727
dc.identifier.jour-issn0927-5398
dc.identifier.olddbid177593
dc.identifier.oldhandle10024/160687
dc.identifier.urihttps://www.utupub.fi/handle/11111/33839
dc.identifier.urlhttps://doi.org/10.1016/j.jempfin.2019.04.001
dc.identifier.urnURN:NBN:fi-fe2021042825378
dc.language.isoen
dc.okm.affiliatedauthorVaihekoski, Mika
dc.okm.discipline511 Economicsen_GB
dc.okm.discipline511 Kansantaloustiedefi_FI
dc.okm.internationalcopublicationnot an international co-publication
dc.okm.internationalityInternational publication
dc.okm.typeA1 ScientificArticle
dc.publisherElsevier
dc.relation.doi10.1016/j.jempfin.2019.04.001
dc.relation.ispartofjournalJournal of Empirical Finance
dc.relation.volume52
dc.source.identifierhttps://www.utupub.fi/handle/10024/160687
dc.titleExpected and realized returns in conditional asset pricing: A new testing approach
dc.year.issued2019

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