Enhanced current-carrying capability in YBCO coated conductor bilayers for high-field applications

Abstract

We have investigated the impact of bilayer structures on the critical current density, J c, of YBa2Cu3O6+x (YBCO) coated conductor films, i.e. films grown on buffered metal substrates, under varying temperature and magnetic field conditions. The bilayers consisted of a YBCO layer free of artificial pinning centers and 8 wt% BaZrO3-added (BZO) layer on top, where the thickness percentage of the layers was varied from 0 to 100 %. The results reveal that the bilayer configuration enhances J c at temperatures below 60 K, with a significant improvement in high magnetic fields (5–8 T) and temperatures ≤20 K. The optimal BZO-added layer thickness was found to be approximately 70 %, reaching 80 % at 8 T. Structural examinations indicate improved growth of YBCO and BZO nanorods in the bilayer structure with BZO-added layer thickness ≤80 %. Theoretical model of the bilayer structure considering the layers as two parallel superconductors with different properties was developed. It was found that the model adequately explains all the experimentally observed tendencies, and thus the observed maximum in J c is due to better growth of the BZO-added layer. The study provides valuable insights for designing optimal bilayer structures for diverse applications operating in different temperature and magnetic field regimes.