Improved crystalline quality and self-field Jc in sequentially vacuum-multilayered YBCO thin films on buffered metallic templates

dc.contributor.authorAye Moe M.
dc.contributor.authorRivasto Elmeri
dc.contributor.authorVaimala Tuomas
dc.contributor.authorZhao Yue
dc.contributor.authorHuhtinen Hannu
dc.contributor.authorPaturi Petriina
dc.contributor.organizationfi=Wihurin fysiikantutkimuslaboratorio|en=Wihuri Physical Laboratory|
dc.contributor.organizationfi=fysiikan ja tähtitieteen laitos|en=Department of Physics and Astronomy|
dc.contributor.organization-code1.2.246.10.2458963.20.26581883332
dc.contributor.organization-code1.2.246.10.2458963.20.55477946762
dc.contributor.organization-code2606701
dc.converis.publication-id179068826
dc.converis.urlhttps://research.utu.fi/converis/portal/Publication/179068826
dc.date.accessioned2025-08-27T23:32:36Z
dc.date.available2025-08-27T23:32:36Z
dc.description.abstract<p>The effect of simple in situ vacuum treatment between the sequentially multilayered YBCO thin films by pulsed laser deposition is investigated. The vacuum treatment during the growth intervals is observed to have a diminishing effect on the formation of structural defects along the <em>c</em> -axis of the YBCO lattice. This greatly improves the structural properties of the film, ultimately resulting in almost 40% increased self-field critical current density. The underlying mechanisms behind the vacuum treatment are comprehensively discussed with the help of Kinetic Monte Carlo simulations, suggesting that the improved crystalline quality of each sublayer results from desorption of weakly bound atomic species from the film surface thus reducing probability of defect formation in the following ablation interval.<br></p>
dc.identifier.eissn1558-2515
dc.identifier.jour-issn1051-8223
dc.identifier.olddbid204156
dc.identifier.oldhandle10024/187183
dc.identifier.urihttps://www.utupub.fi/handle/11111/52296
dc.identifier.urlhttps://ieeexplore.ieee.org/document/10043678
dc.identifier.urnURN:NBN:fi-fe2023033134039
dc.language.isoen
dc.okm.affiliatedauthorAye, Moe
dc.okm.affiliatedauthorRivasto, Elmeri
dc.okm.affiliatedauthorVaimala, Tuomas
dc.okm.affiliatedauthorHuhtinen, Hannu
dc.okm.affiliatedauthorPaturi, Petriina
dc.okm.discipline114 Physical sciencesen_GB
dc.okm.discipline216 Materials engineeringen_GB
dc.okm.discipline114 Fysiikkafi_FI
dc.okm.discipline216 Materiaalitekniikkafi_FI
dc.okm.internationalcopublicationinternational co-publication
dc.okm.internationalityInternational publication
dc.okm.typeA1 ScientificArticle
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.publisher.countryUnited Statesen_GB
dc.publisher.countryYhdysvallat (USA)fi_FI
dc.publisher.country-codeUS
dc.relation.doi10.1109/TASC.2023.3244510
dc.relation.ispartofjournalIEEE Transactions on Applied Superconductivity
dc.source.identifierhttps://www.utupub.fi/handle/10024/187183
dc.titleImproved crystalline quality and self-field Jc in sequentially vacuum-multilayered YBCO thin films on buffered metallic templates
dc.year.issued2023

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