Effect of ex situ Post-annealing Treatments on Sr2FeMoO6 Thin Films
SPRINGER
Pysyvä osoite
Verkkojulkaisu
Tiivistelmä
Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition at optimized deposition atmosphere and temperature. Films were then ex situ post-annealed in different atmospheres and by vacuum annealing at temperatures between 500 A degrees C and 1100 A degrees C. Ar and air annealed samples were destroyed by ex situ post-annealing treatment, due to formation and dominance of SrMoO4 impurity phase. X-ray diffraction showed no impurities and full texturation of vacuum and ArH2 (5%) annealed samples. Those samples showed also similar magnetic and magnetoresistive behavior like as-deposited sample. Neither magnetic, magnetotransport nor structural properties could be improved by ex situ post-annealing treatments.